On Wed, Jan 29, 2025 at 12:44 PM vignesh C <vignesh21@gmail.com> wrote:
>
> On Tue, 28 Jan 2025 at 17:28, Nisha Moond <nisha.moond412@gmail.com> wrote:
> >
> > Please find the attached v64 patches. The changes in this version
> > w.r.t. older patch v63 are as -
> > - The changes from the v63-0001 patch have been moved to a separate thread [1].
> > - The v63-0002 patch has been split into two parts in v64:
> > 1) 001 patch: Implements the main feature - inactive timeout-based
> > slot invalidation.
> > 2) 002 patch: Separates the TAP test "044_invalidate_inactive_slots"
> > as suggested above.
>
> Currently the test takes around 220 seconds for me. We could do the
> following changes to bring it down to around 70 to 80 seconds:
>
Even then it is too long for a single test to be part of committed
code. So, we can temporarily reduce its time but fixing comments on
this is not a good use of time. We need to write this test in some
other way if we want to see it committed.
--
With Regards,
Amit Kapila.
